“From FET to EIC-Pathfinder” presented in
Special Live Event of SPIE Optical Metrology, 2021
Our special thanks to invited speaker Ioannis Fiamegkos from European
Innovation Council and SMEs Executive Agency (EISMEA) (Belgium)
“From FET to EIC-Pathfinder” presented in
Special Live Event of SPIE Optical Metrology, 2021
Our special thanks to invited speaker Ioannis Fiamegkos from European
Innovation Council and SMEs Executive Agency (EISMEA) (Belgium)